Theory of intense beams of charged particles: Optics of Charged Particle Analyzers eBook
Original price was: $238.00.$150.00Current price is: $150.00.
Delivery: Can be download immediately after purchasing. For new customer, we need process for verification from 30 mins to 12 hours.
Version: PDF/EPUB. If you need EPUB and MOBI Version, please send contact us.
Compatible Devices: Can be read on any devices
Advances in Imaging and Electron Physics merges two long-running serials–Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians
Be the first to review “Theory of intense beams of charged particles: Optics of Charged Particle Analyzers eBook”
You must be logged in to post a review.
Related products
Bestsellers
Bestsellers
Bestsellers
Bestsellers
Bestsellers
Reviews
There are no reviews yet.